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Seed Crystal Inspector SC-Seed is mainly used for seed crystal inspection in photovoltaic crystal pulling workshops, including crack defect detection, dimension measurement, seed code recognition, etc. The equipment is powerful, efficient, and highly accurate, solving the blind spots of manual crack detection and improving efficiency in the seed crystal stage.
Device image 1
Device image 2
Device image 3Detect cracks, surface scratches, edge chipping, dimensional deviations, etc., record quality data, and optimize production processes.
Eliminate new defects generated during transportation and storage, reducing production risks.
Provide accurate seed quality data support for new material R&D and special crystal preparation.
Fast and accurate inspection before loading the seed into the crystal puller, preventing failures such as ingot breakage or polycrystalline inclusions during the pulling process.
Detect internal cracks (invisible to the naked eye) and surface defects in seeds: surface cracks, scratches, crescent marks, edge chipping, processing marks, etc.
Precise measurement of large-end diameter, small-end diameter, taper, and length.
Automatically identify codes on seeds for traceability.
Analyze internal stress distribution in seeds to prevent breakage during crystal pulling.
Reserved interface for automatic feeding to enable automated loading.
Reserved MES interface for data upload.
Adjusts the camera angle to fill the blind spot in the traditional method at the seed's tapered neck, capable of identifying multiple defects.
Adopts a parallel optical scheme to eliminate specular reflection, resulting in sharp edges and high dimensional measurement accuracy.
The high dynamic range infrared camera easily switches detection modes for both pre- and post-acid washing processes.
Detects stress distribution in seeds to prevent breakage caused by excessive stress during crystal pulling.
| Parameter | Specification |
|---|---|
| Model | SC-Seed |
| Transmission Camera | 1k line scan |
| Character Recognition Camera | 1280×1024 |
| Dimension Camera | 5120×5120 |
| Detectable Types | Crack, stress, character recognition, dimension measurement |
| Equipment Dimensions | 128cm×152cm×161cm |
| Infrared Detection Accuracy | 0.075mm/pixel |
| Dimension Measurement Accuracy | 0.009mm/pixel |
| Character Detection Accuracy | 0.05mm/pixel |
| Diameter Detection Range | 1-49mm |
| Length Detection Range | 100mm-300mm |
| Test Platform | Windows |
| Power Consumption | 800W |
| Input Voltage | AC 220V |
| Computer | DELL |
| Monitor | 2K touchscreen monitor |
| Data Storage | 100,000 images |
| Inspection Objects | Incoming seeds, outgoing seeds, crystal pulling workshop |
| Weight | 160kg |
| Operating Temperature | -30℃~50℃ |
| Relative Humidity | ≤85%RH |
| Defect Type | Actual Image | Detection Image |
|---|---|---|
| Large-End Crescent Mark |  |  |
| Large-End Chamfer Chipping |  |  |
| Small Pit on Slope |  |  |
| Processing Marks |  |  |
| Chamfer Crack |  |  |
Blind-spot-free infrared detection, high-precision dimension measurement, stress analysis, and code recognition comprehensively ensure seed crystal quality, improve crystal pulling success rates, and reduce production risks.
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